“A new recontruction algorithm for use with capacitance-based tomography”

Authors: Ø. Isaksen and J.E. Nordtvedt,
Affiliation: University of Bergen, Christian Michelsen Research and International Research Institute of Stavanger (IRIS)
Reference: 1994, Vol 15, No 1, pp. 9-21.

Keywords: Process measurements, multiphase flow, tomography

Abstract: A new reconstruction algorithm for use with capacitance-based process tomography is proposed. A numerical simulator, capable of calculating the capacitances for a particular sensor configuration and flow regime is used together with a parameter representation of the dielectric distribution and an optimization algorithm. The algorithm calculates these parameters and hence the dielectric distribution, by minimizing a function defined as a weighted sum of square differences between the measured and estimated capacitances. The method is tested by using both synthetic and experimental data, and the results are compared with results from the commonly used Linear Back Projection (LBP) algorithm. The method is capable of obtaining the correct parameter values for all the flow regimes tested, and does provide a better estimate than the LBP method. The method proves to be very promising, and is a step towards quantitative capacitance tomography.

PDF PDF (2011 Kb)        DOI: 10.4173/mic.1994.1.2

DOI forward links to this article:
[1] Trevor York (2001), doi:10.1117/1.1377308
[2] Trevor York (2004), doi:10.1201/9781420034462.ch10
[3] H S Tapp, E K Kemsley, R H Wilson and M L Holley (1998), doi:10.1088/0957-0233/9/4/006
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[5] Øyvind Isaksen (1996), doi:10.1088/0957-0233/7/3/013
[6] R.M West, X Jia and R.A Williams (2000), doi:10.1016/S1385-8947(99)00137-0
[7] Marco Antonio Rodriguez-Frias and Wuqiang Yang (2019), doi:10.1109/JSEN.2019.2899210
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BibTeX:
@article{MIC-1994-1-2,
  title={{A new recontruction algorithm for use with capacitance-based tomography}},
  author={Isaksen, Ø. and Nordtvedt, J.E.},
  journal={Modeling, Identification and Control},
  volume={15},
  number={1},
  pages={9--21},
  year={1994},
  doi={10.4173/mic.1994.1.2},
  publisher={Norwegian Society of Automatic Control}
};